搜索结果: 1-9 共查到“会议中心 Inspection”相关记录9条 . 查询时间(0.078 秒)
Academy of Mathematics and Systems Science, CAS Colloquia & Seminars：Pandora Box Problem with Nonobligatory Inspection: Hardness and Approximation Scheme
潘多拉盒问题 非强制性检查 硬度 近似方案
2023/4/14
Weitzman (1979) introduced the Pandora Box problem as a model for sequential search with inspection costs, and gave an elegant index-based policy that attains provably optimal expected payoff. In vari...
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）
2018年 SPIE 微光刻的计量，检验和过程控制 会议
2017/10/27
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）。
2018年SPIE三维光学计量检验实际应用会议（SPIE Dimensional Optical Metrology and Inspection for Practical Applications VII）
2018年 SPIE 三维光学计量检验实际应用 会议
2017/10/27
This conference will focus on methods, analysis, and applications of optical metrology and inspection as applied to various industries, with particular emphasis on practical applications for non-optic...
2017 SPIE 工业检验用光学测量系统会议（2017 Conference on Optical Measurement Systems for Industrial Inspection X）
2017 SPIE 工业检验 光学测量 系统会议
2017/4/25
Conference Sessions 1: Interometric Techniques I Congress-wide Plenary Session 2: Interometric Techniques II 3: Digital Holography and Holographic Microscopy 4: OCT and Coherence Scanning 5: High-Spee...
2017 SPIE 自动视觉检查和机器视觉会议（2017 Conference on Automated Visual Inspection and Machine Vision）
2017 SPIE 自动视觉检查 机器视觉 会议
2017/4/25
Conference Sessions:1: Image Acquisition 2: Simulation 3: Multispectral inspection Posters--Thursday 4: Inspection, Monitoring and Detection .
2017SPIE工业检验用光学测量系统会议（2017 Conference on Optical Measurement Systems for Industrial Inspection X）
2017 SPIE 工业检验用光学测量系统 会议
2017/4/25
2017SPIE工业检验用光学测量系统会议（2017 Conference on Optical Measurement Systems for Industrial Inspection X）。
2017SPIE自动视觉检查和机器视觉会议（2017 Conference on Automated Visual Inspection and Machine Vision）
2017 SPIE 自动视觉检查和机器视觉 会议
2017/4/25
2017SPIE自动视觉检查和机器视觉会议（2017 Conference on Automated Visual Inspection and Machine Vision）。
2017SPIE生物材料检测，表征和光学成像方法会议（2017 Conference on Optical Methods for Inspection,Characterization,and Imaging of Biomaterials）
2017 SPIE 生物材料检测，表征和光学成像方法 会议
2017/4/25
2017SPIE生物材料检测，表征和光学成像方法会议（2017 Conference on Optical Methods for Inspection,Characterization,and Imaging of Biomaterials）。
2017年SPIE微光刻的计量，检查和过程控制会议（Metrology,Inspection,and Process Control for Microlithography XXXI）
2017年 SPIE微光刻的计量，检查和过程控制 会议
2017/1/12
Review conference details by clicking on the titles below. These details include paper titles, authors, schedules and abstracts. View Proceedings from last year.SPIE conference papers are published in...
