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A New Junction Parameters Determination Using the Double Exponential Model
Characteristic Junction Parameters Extraction Modeling
2010/12/7
A double exponential model is used to characterize the junction properties of microelectronic devices. A method is developed to extract the physical junction parameters from the current-voltage charac...
Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor
Junction Parameters an Electrically Stressed NPN Bipolar Transistor
2010/12/8
The effect of an electrical ageing on npn bipolar transistor has been studied. The current gain decreases substantially and the electrical properties are discussed. The emitter-base junction parameter...
