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Transport Phenomena in Fluids: Finite-size scaling for critical behavior
Transport Phenomena critical behavior
2010/11/19
Results for transport properties, in conjunction with phase behavior and thermodynamics, are
presented at the criticality of a binary Lennard-Jones fluid from Monte Carlo and molecular dy-
namics si...
Scaling of noise correlations in one-dimensional lattice hard-core boson systems
Scaling of noise correlations one-dimensional lattice hard-core boson systems
2010/11/24
Noise correlations are studied for systems of hard-core bosons in one-dimensional lattices. We use an exact numerical approach based on the Bose-Fermi mapping and properties of Slater determinants.We ...
Scaling and self-averaging in the three-dimensional random-field Ising model
Scaling self-averaging three-dimensional random-field Ising model
2010/11/25
We investigate, by means of extensive Monte Carlo simulations, the magnetic critical behavior of the three-dimensional bimodal random-field Ising model at the strong disorder regime.We present results...
Contact process with a defect: universal oasis, nonuniversal scaling
Contact process defect: universal oasis nonuniversal scaling
2010/11/23
The extinction transition in the presence of a localized quenched defect is studied umerically.
When the bulk is at criticality, the correlation length diverges and even an infinite system cannot ”de...
专著信息
书名
Scaling behavior of the c-axis E-J characteristics for Bi-2212 single crystal
语种
英文
撰写或编译
作者
Saijun Huang,Guohua Zhang,Jing Chen,Sheng Luo
第一作者单位
出版社
Physica C 389 (2003)723-724
出版地
出版日期
2003年...
期刊信息
篇名
The materials equation and scaling law of flux pinning
语种
英文
撰写或编译
作者
尹道乐，李传义等
第一作者单位
刊物名称
Applied Superconductivity
页面
1998,5,No.1-6,147-150
出版日期
1998年
月
日
文章标识(ISSN)
相关项目
新型金属多层膜中界面物理与伏安特性的研...
Scaling Laws in PZT Thin Films Grown on Si(001) and Nb-Doped SrTiO3(001) Substrates
PZT Thin films AFM Scaling laws
2010/9/29
A dynamic scaling and kinetic roughening study was done on digitized atomic force microscope (AFM) images of Pb(Zr0:52;Ti0:48)O3 (PZT) thin films. The films were grown on Si(001) and Nb¡SrTiO3(0...
How Round is Round? On Accuracy in Complex Dielectric permittivity calculations: A Finite-Size Scaling Approach
Dielectric mixtures composite materials the finite element method finite size scaling
2010/4/13
Accuracy in complex dielectric permittivity calculations in binary dielectric mixtures in two-dimensions are reported by taking into account the shape of the inclusion phase. The dielectric permittivi...