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Characterization of carbon compounds on a pyroxene surface from a gabbro xenolith in basalt by time-of-flight secondary ion mass spectrometry
Characterization carbon pyroxene surface gabbro xenolith time-of-flight
2012/3/31
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) yields mass spectra of the upper several monolayers of an analytical surface. The applicability of TOF-SIMS to the characterization of C compo...
