搜索结果: 16-30 共查到“知识库 集成电路技术”相关记录477条 . 查询时间(1.937 秒)
![](http://www.firstlight.cn/upload/imgfile/20229/16/2022916135352579.png)
基于导波驱动相变材料超构表面的基波及二次谐波聚焦
波导 聚焦 二次谐波 超构表面
2022/3/17
通过对Buck变换器和Buck-Boost变换器中的储能元器件进行分析,从中构造出2种开关电感降压单元,分析了降压单元的工作原理,探讨了降压开关电感结构与升压开关电容结构之间的对偶关系。从二次型Buck变换器中提取前级降压单元,将其与2种降压开关电感单元进行组合,从而提出了一种具有降压单元的新型组合Buck变换器。通过分析变换器CCM和DCM的工作模态、工作波形以及各项参数,将变换器中的磁性元件进...
![](http://www.firstlight.cn/upload/imgfile/20228/13/2022813213522737.jpg)
![](http://www.firstlight.cn/upload/imgfile/20228/13/2022813212549785.jpg)
![](http://www.firstlight.cn/upload/imgfile/20228/13/2022813212349588.jpg)
![](http://www.firstlight.cn/upload/imgfile/20244/3/202443153816742.jpg)
![](http://www.firstlight.cn/upload/imgfile/202210/4/2022104175737956.png)
基于粒子群算法优化最小二乘支持向量机的电路故障诊断方法
故障诊断 粒子群算法 最小二乘支持向量机
2016/7/25
针对数/模混合电路故障的特点,采用将粒子群算法与最小二乘支持向量机相结合的故障诊断方法,在保证诊断过程准确率的基础上,实现多类故障的快速诊断。在诊断过程中,支持向量机的参数寻优过程存在随意性、盲目性和效率低等问题,采用改进的粒子群算法优化支持向量机的参数,建立基于支持向量机的故障分类模型。实验结果表明,与其他方法相比,该方法提高了故障诊断的精度,具有明显的实用价值。
Modeling and simulation of luminescence detection platforms
Luminescence probes Modeling CMOS sensor Post-processing
2015/8/12
Motivated by the design of an integrated CMOS-based detection platform, a simulation model for CCD and CMOS imager-based luminescence detection systems is developed. The model comprises four parts. Th...
Analysis of Active Pixel Sensor Readout Circuit
Active pixel sensor (APS) CMOS image sensor high-speed imaging readout electronics
2015/8/12
This brief provides a detailed analysis of active pixel sensor, pixel and column circuit. Surprisingly, we find that shorter readout times can be achieved by reducing the bias current and hence reduci...
Analysis of 1=f Noise in Switched MOSFET Circuits
1 noise CMOS image sensor nonstationary noise model periodically switched circuits phase noise ring oscillator time-domain noise analysis
2015/8/12
Analysis of 1 noise in MOSFET circuits is typically performed in the frequency domain using the standard stationary 1 noise model. Recent experimental results, however, have shown that the estimates u...
A 640 512 CMOS Image Sensor with Ultrawide Dynamic Range Floating-Point Pixel-Level ADC
Analog-to-digital conversion (ADC) CMOS image sensors digital cameras dynamic range image sensors mixed analog–digital integrated circuits pixel-level ADC video cameras
2015/8/12
Analysis results demonstrate that multiple sampling can achieve consistently higher signal-to-noise ratio at equal or higher dynamic range than using other image sensor dynamic range enhancement schem...
A Nyquist-Rate Pixel-Level ADC for CMOS Image Sensors
Analog-to-digital conversion cameras CMOS image sensors image sensors mixed analog–digital integrated circuits pixel-level analog-to-digital converter (ADC) video cameras
2015/8/12
A multichannel bit-serial (MCBS) analog-to-digital converter (ADC) is presented. The ADC is ideally suited to pixel-level implementation in a CMOS image sensor. The ADC uses successive comparisons to ...