搜索结果: 1-4 共查到“电子科学与技术 Stress”相关记录4条 . 查询时间(0.383 秒)
VIRTEX 4 LX200 automated temperature stress test serial interface and test control logic design implementation
Automatic test hot chamber temperature pressure equipment temperature
2014/12/31
The overall project is to create a system that automatically tests the internal components of Xilinx Virtex 4 LX200 device, while the device is running in a thermal chamber at temperatures that stress...
The Effect of Residual Stress on the Electromechanical Behavior of Electrostatic Microactuators
Residual Stress the Electromechanical Behavior Electrostatic Microactuators
2010/12/6
This work simulates the nonlinear electromechanical behavior of different electrostatic microactuators. It applies the differential quadrature method, Hamilton's principle, and Wilson-θ integration me...
Analysis and Simulation of Functional Stress Degradation on VDOMS Power Transistors
Functional Stress VDOMS Power Transistors
2010/12/7
The use of VDMOS transistor under certain functional stress conditions produces a modification of its physical and electrical properties. This paper explores the physical analysis and SPICE simulation...
Impact of the Stress on the Sub-Micron N-Metal Oxide Semiconductor Field Effect Transistor Characteristics
Hot-carrier-injection Stress time Drain current Transconductance MOSFET
2010/12/8
In this paper, we present a drain current model for stressed short-channel MOSFET's. Stress conditions are chosen so that the interface states generated by hot-carriers are dominant. The defects gener...