搜索结果: 1-15 共查到“光学仪器及技术 SPIE”相关记录19条 . 查询时间(0.08 秒)
中国科学院深圳先进技术研究院刘成波副研究员入选SPIE与OSA Senior Member（图）
中国科学院深圳先进技术研究院 刘成波 副研究员 SPIE OSA Senior Member
2020/7/20
近日，中国科学院深圳先进技术研究院医工所生物医学光学与分子影像研究室刘成波副研究员先后入选国际光学工程学会、美国光学学会高级会员（Senior Member）。国际光学工程学会（Society of Photo-Optical Instrumentation Engineers, SPIE）与美国光学学会（The Optical Society of America, OSA）是光学领域最有影响力...
2018年SPIE红外遥感和仪器会议（SPIE Infrared Remote Sensing and Instrumentation XXVI）
2018年 SPIE 红外遥感和仪器 会议
2017/11/27
A great deal of knowledge about the Earth's environment and about space (including outer space) has recently been acquired using infrared remote sensing and astronomical techniques. In this conference...
2018年SPIE光学仪器科学，技术和应用会议（SPIE Optical Instrument Science,Technology,and Applications）
2018年 SPIE 光学仪器科学，技术和应用 会议
2017/10/27
This conference is accepting abstract submissions through Monday, 20 November.Optical instruments play an extremely large role in the application and development of future capability in optics and pho...
2018年SPIE红外成像系统会议（The SPIE Infrared Imaging Systems:Design,Analysis,Modeling,and Testing XXIX）
2018年 SPIE 红外成像系统 会议
2017/10/27
Sensor technologies are undergoing revolutionary advances. Increases in spatial, spectral, and temporal resolution, and in breadth of spectral coverage, render feasible sensors that function with unpr...
2018年SPIE下一代光谱技术会议（SPIE Next-Generation Spectroscopic Technologies XI）
2018年 SPIE 下一代光谱技术 会议
2017/10/27
This will be the eleventh year of this conference: it premiered at Optics East 2007 in Boston, MA and is now part of the SPIE Commercial + Scientific Sensing and Imaging Symposium. For the past five y...
SPIE Newsroom报道中国科学院长春光学精密机械与物理研究所在大尺寸碳化硅反射镜研制技术上的突破性进展（图）
中国科学院长春光学精密机械与物理研究所 大尺寸碳化硅反射镜 大口径碳化硅光学材料 光学工程
2016/8/24
应国际光学工程学会（SPIE）的邀请，中国科学院光学系统先进制造技术重点实验室张舸副研究员于2016年8月9日，在SPIE的在线刊物SPIE Newsroom上发表文章（标题：”Fabricating large-scale mirrors using reaction-bonded silicon carbide”），介绍该团队在大尺寸碳化硅反射镜研制技术上的突破性进展。长期以来，世界各国的科研...
New photonics for medicine, public safety, and more on the program at SPIE Defense, Security, and Sensing
sensing technologies microscopy forensics
2011/4/22
New conferences on sensing technologies and microscopy technologies with multiple applications from medicine and forensics to defense and homeland security join a broad-ranging established program at ...
SPIE wins BNA for design work on Prism Awards for Photonics Innovation（图）
SPIE BNAs -- design competition Photonics Innovation
2011/4/21
SPIE is among the winners named recently in the inaugural Brand New Awards -- BNAs -- design competition, for identity work done surrounding the Prism Awards for Photonics Innovation.
SPIE volunteers deliver science R&D and education support message to Congress（图）
SPIE volunteers important economic Science-Engineering-Technology
2011/4/21
SPIE volunteers traveled to Washington, D.C., last week to express support for funding federal research and development programs and to discuss the important economic impacts of such programs.
EUV is hot topic at SPIE Advanced Lithography 2011（图）
SPIE EUV Advanced Lithography semiconductor industry
2011/4/21
First noted in 1965, Moore's law describes the trend of increasing computer technology, which has continued for more than 50 years and is expected to keep going for decades more in the semiconductor i...
SPIE leaders express condolences to people of Japan following earthquake and tsunami
SPIE massive tsunami hitting coastal nuclear-powered electrical plants
2011/4/21
SPIE Members in Japan are among those assessing damage and looking for the way forward after Friday's 8.9-magnitude earthquake northeast of Tokyo that triggered a massive tsunami hitting coastal areas...
SPIE Optical Metrology has solutions for design, modelling and inspection（图）
SPIE Optical Metrology optical measurement technologies
2011/4/21
New research in optical measurement technologies enabling applications in industry, research modelling, inspection of nanostructures and artwork, and related topics will be presented at SPIE Optical M...
SPIE appoints Chris Mack editor of 'Journal of Micro/Nanolithography, MEMS, and MOEMS'
SPIE Micro/Nanolithography MEMS MOEMS
2011/4/22
SPIE has announced the appointment of renowned lithography expert Chris A. Mack, adjunct faculty member at the University of Texas at Austin, as editor of the Journal of Micro/Nanolithography, MEMS, a...
Community readies for SPIE Advanced Lithography amidst market growth indicators（图）
SPIE semiconductor industry EUV
2011/4/22
Bolstered by a record 2010 and continued indicators predicting market growth for the industry, the lithography community is preparing for its annual gathering at SPIE Advanced Lithography. Finding sol...
ALOP team wins SPIE Educator Award for bringing light through hands-on training
ALOP SPIE Photonics
2011/4/22
The Active Learning in Optics and Photonics team (ALOP) has won the 2011 SPIE Educator Award in recognition of the team's achievements in bringing basic optics and photonics training to teachers in th...