搜索结果: 1-12 共查到“光学工程 metrology”相关记录12条 . 查询时间(0.102 秒)
2018年SPIE光学制造，测试和计量会议（SPIE Optical Fabrication,Testing,and Metrology VI）
2018年 SPIE 光学制造，测试和计量 会议
2017/10/27
Today’s optical fabrication technologies are facing ever-increasing demands from industry and research. This is driven by tough requirements for cost and time reduction in production and R&D as well a...
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）
2018年 SPIE 微光刻的计量，检验和过程控制 会议
2017/10/27
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）。
2018年SPIE三维光学计量检验实际应用会议（SPIE Dimensional Optical Metrology and Inspection for Practical Applications VII）
2018年 SPIE 三维光学计量检验实际应用 会议
2017/10/27
This conference will focus on methods, analysis, and applications of optical metrology and inspection as applied to various industries, with particular emphasis on practical applications for non-optic...
2017SPIEX射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）
2017 SPIEX 射线和EUV光学计量学进展 专题会议
2017/4/25
2017SPIEX射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）。
2017SPIE光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）
2017 SPIE 光学计量建模 会议
2017/4/25
2017SPIE光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）。
Take this opportunity to share your research at SPIE Optical Metrology 2017. Come to Munich to meet with users and researchers to discuss the latest inventions and applications in the field of optical...
2017第10届慢光，快光和光电原子精密计量研讨会（Slow Light,Fast Light,and Opto-Atomic Precision Metrology X）
2017 第10届 慢光，快光和光电原子精密计量 研讨会
2017/1/12
OPTO is organized into eight tracks. Choose a track and click to see the list of conferences.Review conference details by clicking on the titles below. These details include paper titles, authors, sch...
SPIE Optical Metrology has solutions for design, modelling and inspection（图）
SPIE Optical Metrology optical measurement technologies
2011/4/21
New research in optical measurement technologies enabling applications in industry, research modelling, inspection of nanostructures and artwork, and related topics will be presented at SPIE Optical M...
Ultra-broadband optical chirp linearization for precision length metrology applications
Laser stabilization Metrology Range finding Lidar
2015/6/8
We demonstrate precise linearization of ultra-broadband (>5 THz) laser frequency sweeps using a fiber-based self-heterodyne technique. Frequency errors less than 170 kHz relative to linearity were obs...
Advanced Optical Metrology Using Ultrashort Pulse Lasers
Optical metrology Interferometry Distance measurement
2009/6/1
Emerging possibilities of using ultrashort pulse lasers as a new light source for advanced optical metrology are addressed in comparison to traditional sources such as CW lasers and white light. Empha...
Metrology of Mo/Si multilayer mirrors at 13.5 nm with the use of a laser-produced plasma extreme ultraviolet (EUV) source based on a gas puff target
laser-produced plasma extreme ultraviolet (EUV) source
2011/5/3
In this paper an application of a recently developed laser plasma source of extreme ultraviolet (EUV) for optical measurements of optical characteristics of Mo/Si multilayer mirrors is presented. The ...
Realization of luminous flux unit lumen at National Metrology Institute of Turkey (UME)
luminous flux lumen integrating sphere illuminance characterization uncertainty
2011/4/25
Luminous flux calibration facility with an integrating sphere has been installed at the National Metrology Institute of Turkey (UME) in order to realize lumen. A LabView-based computer-controlled elec...