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Identification of pore size in porous SiO2 thin film by positron annihilation
Al-Si thin film porous SiO2 thin film positron annihilation
2009/8/14
Positron annihilation lifetime and Doppler broadening of annihilation line techniques have been used to obtain information about the small pore structure and size of porous SiO2 thin film produced by ...
Study of the Electron-Positron Annihilation Coincidence Peak Two-Dimensional Profile
the Electron-Positron Annihilation Coincidence Peak Two-Dimensional Profile aluminum Ge detectors
2010/10/26
Positron annihilation radiation profile in aluminum was observed with a pair of Ge detectors in coincidence. 22Na was used as a source of positron and the two-dimensional gamma energy spectrum was fit...